Copyright © XRD.US
STOE & CIE GmbH
Stoe is a company with an excellent reputation for building the
highest quality powder and single crystal diffractometers. When concerns are
reliability, accuracy and excellent customer service you can relay on this
marvel of German engineering.
A powder diffractometer system with the possibility to use
one or two independent either horizontal or vertical mounted goniometers on
one X- tube (or one goniometer and one small angle unit).
The STOE Transmission / Debye-Scherrer goniometer with
focusing primary monochromator (symmetric curved Ge(111)) provides excellent
resolution and symmetrical peak profiles. The STOE Bragg/Brentano
goniometer can be equipped on request with mirrors or plane monochromator.
Typical sample holders are capillary spinners with or without
goniometer head, transmission or reflection mode sample holders. Sample
changers for 30 transmission samples, 10 capillaries or 12 reflection
samples of various thickness available. High/ low temperature attachments,
Linear position sensitive detector with up to 6° aperture or
140° curved imaging plate detector or scintillation counter.
geometries in one diffractometer: Transmission/Debye-Scherrer, micro
diffraction as well as low and high resolution Bragg/Brentano. Primary beam
monochromator (asymmetric curved Ge(111)).
Sample holders: As above and multi purpose analyzer stage, Eulerian cradle.
Linear PSD, scintillation counter with or without secondary monochromator,
curved imaging plate detector.
STADI P COMBI
Vertically built STADI P
for combinatorial or high throughput analysis in transmission mode.
Horizontally mounted x/y-sample stage, sample holders with up to 96 wells,
humidity chamber, capillary and transmission sample holder. Automated
evaluation software. Linear PSD or curved imaging plate detector.
Theta/theta diffractometer with manual or
automated slit system, as well as X-ray mirrors or secondary monochromator.
Linear PSD or scintillation counter. Different sample holders and O.E.M.
All Stoe diffractometers
come with efficient state-of-the-art control and evaluation software
Optional packages like Search/Match, Reflectometry, GMP etc. available.
Bede D1 is a general-purpose high-resolution diffractometer, used world-wide
in industrial, university and government research laboratories. It has the
highest precision optical encoders in a commercial instrument (0.00005
degrees) and is capable of performing all of the tasks below:
resolution diffraction rocking curves, q -2 q scans
Triple axis scans (reciprocal space mapping)
Grazing incidence reflectivity, both specular and diffuse scatter
Powder diffraction with metrological accuracy of 0.002°
Texture and stress measurements
topography, with the new BedeScan attachment Grazing incidence XRD for
BRUKER AXS Inc.
Madison, WI 53711 USA
All tasks for
qualitative and quantitative phase analysis, peak profile analysis, residual
stress determination and structure solution: powder samples, oriented
powder, thin and small samples, suitably shaped samples,
environment-sensitive samples, irregularly shaped samples, small sample
amounts. D4/S4 combined system for XRD
and XRF application.
Bragg-Brentano or Göbel Mirrors
system for powder diffraction applications. Bragg-Brentano and parallel beam
diffractometer with parallel beam and Bragg-Brentano geometry
Cradle sample stage, reflectometry, thin films, semiconductors. Also
available with GADDS detector. For high-throughput combinatorial screening
the GADDS CS/CST provides for rapid screening of materials libraries,
in reflection or in transmission geometry
Small angle X-ray
scattering system. Nanostructure
analysis by means of Small Angle X-ray Scattering (SAXS), nanostructure
mapping by means of X-ray Nanography, molecular structure determination by
means of Wide Angle X-ray Scattering (WAXS)
High capability and precision
Multipurpose, High performance, high flexibility, high precision
diffractometer. Parallel beam optics, focusing Ka1
Multifunctional and high speed (curved Position Sensitive Detector)
diffractometer system, several high and low temperature attachments
Materials characterization, Seven motorized degrees of freedom, Big Eulerian
cradle open chi-circle. Suitable for man applications, including texture,
thin film, strain, reflectometry.
Portable diffractometer for Residual Stress
provides a fast tool for detecting X-rays based upon our unique position
sensitive detector designs. INEL systems range from routine powder
diffractometers to complex goniometers for texture or thin films
measurements. A vast variety of sample holders and thermal stages adapt to
the goniometer, offering enhanced capabilities performance for many
experiments, including thin films, dynamic and in-situ studies. INEL also
proposes a set of other devices to increase the comfort of users.
Advanced powder diffractometer
The X’Pert PRO MPD is the multi-purpose X-ray diffraction
system for the analytical laboratories in universities and industry. It is
the ideal system for demanding environments where different people with
different samples are performing different types of analysis.
CubiX PRO and CubiX FAST
diffraction particularly suitable for industrial process control integration
Small angle X-ray
scattering is a versatile technique for studying structural details in the
nanometer range. Wide angle X-ray scattering allows local ordering to be
recognized in e.g. polymers and membranes. Combined in one system, the two
techniques form an exceptionally powerful analytical solution
Thermo Electron Corp.
ARL X'TRA powder diffractometer
The ARL X'TRA is a
state-of-the-art instrument for powder X-ray diffraction: the new
engineering design of the goniometer and Peltier colled Si(Li) solid state
detector produce a high performance instrument at an affordable price.
include: Qualitative and quantitative phase analysis, Standardless
quantitative analysis by Rietveld method, Crystallographic analysis,
Low and high temperature XRD
thickness, preferred orientation, composition, and perfection of these
crystals as well as epitaxially grown crystals.
products to perform the latest materials analysis tasks
provides a dedicated 2D system for small angle scattering. This system can
extend SAXS measurements to anisotropic materials such as films and fibers.
This system is ideal for membranes and free-standing coatings.
D/MAX 2000 PC
family of X-ray diffractometers continues to evolve with the 2000/PC. This
system includes focusing and parallel-beam optics, which can be exchanged by
the user in half a minute without realignment.
another breakthrough with the D/MAX-RAPID microdiffraction system. The
curved image plate technology offers high-sensitivity, high-resolution,
high-speed and large area compared with multiwire and CCD technology.
The Miniflex is a
compact X-ray diffraction system which can be transported from the
laboratory to the field. It can be readily installed at any location,
including the sampling site.
The Multiflex is
affordable "theta-theta" X-ray diffraction system. This precise instrument
is a powerful yet easy-to-use analytical tool; and, the accompanying
software which works in a Windows™ environment is the industry standard.
Crystal Orientation System
crystals with characteristics optimal for various end uses, demands accurate
control of the cutting direction with respect to the crystal axis and
precise measurement of the crystal orientation. The Rigaku Piezo Goniometer
(2990 Series) is designed to meet this demand.
incorporated this PSPC detector with its X-ray stress analyzer system to
obtain high-speed and micro-area measurement of residual stress. Compared
with the conventional method, the measurement time can be reduced
drastically, 10 to 100 times faster depending upon the kind of measurement.
goniometer system, TTRAX, is the world's first diffraction system
specifically designed to incorporate the 18 kW rotating anode X-ray high
power X-ray generator into the q/q
configuration. Thus, the system permits measurement of free liquid surfaces
of materials including room temperature liquids and substances in their
problems can be overcome by simultaneously performing XRD and DSC
measurements on the same sample, and thus Rigaku/MSC offers the XRD-DSC for
these special applications.
SuperBright supersedes the proven FR-D as the home laboratory source with
the highest usable flux.
Compact powder diffractometer with parallel beam and focusing geometry.
Multiply sample stages, auto sampling. Suitable for most powder diffraction
applications -thin film, stress, texture etc.. XRF detector for simultaneous
General purpose diffractometer
performance parallel beam geometry diffractometer
high precision theta - theta goniometer for large samples. Large R-theta
stage enables automatic stress mapping over entire sample up to 350mm